In this project, we aim to build an Attendance marking system with the help of face recognition. Every institute has its own
method of marking student’s attendance and keeping record each and every student. Some institutes are marking attendance manually
using traditional system and few of them have adopted the automatic methods of taking attendance. This system is developed for an easy
way of marking attendance and to overcome the difficulty in the manual based attendance system. This paper proposes the techniques to
be used in order to handle the threats. In this paper, we proposed a combination of LBP and HOG for better results and accuracy.
Palak M Jain : Department of Computer Science and Engineering,
SRM Institute of Science and Technology,
Chennai, Tamil Nadu, India.
Shipra Singh : Department of Computer Science and Engineering,
SRM Institute of Science and Technology,
Chennai, Tamil Nadu, India.
Nikita Singh : Department of Computer Science and Engineering,
SRM Institute of Science and Technology,
Chennai, Tamil Nadu, India.
Nancy Hablani : Department of Computer Science and Engineering,
SRM Institute of Science and Technology,
Chennai, Tamil Nadu, India.
Dr. G. Paavai Anand : Department of Computer Science and Engineering,
SRM Institute of Science and Technology,
Chennai, Tamil Nadu, India.
Local Binary Pattern (LBP), Histogram of Oriented Gradients (HOG)
These applications deals with robust and secure
technologies. The chances of losing the data or faulty
attendance being marked are highly reduced. The
application is also handy to use and will be of a great
help to the teachers as it saves time and reduces the
manual effort that it is presently put into it. The
intervention of a third person is also removed to maintain
these databases and collectively sum up the attendance
[18]. From this paper, survey on LBP and histogram of
oriented gradients has been studied in detail. This
method is reliable.
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